APA Style
KALA, PARAG K.. (1997).
Digital circuit testing and testability (1).
TORONTO:
AP.
Chicago Style
KALA, PARAG K..
Digital circuit testing and testability.
1
TORONTO:
AP,
1997.
TXB.
MLA Style
KALA, PARAG K..
Digital circuit testing and testability.
1
TORONTO:
AP,
1997.
TXB.
Turabian Style
KALA, PARAG K..
Digital circuit testing and testability.
1
TORONTO:
AP,
1997.
TXB.