APA Style
BRULS, DOMINIQUE MARIA. (2003).
Direct profiling of III/V semiconductor nanostructures at the atomic level by cross-sectional scanning tunneling microscopy (1).
Eindhoven:
Technische Universiteit Eindhoven.
Chicago Style
BRULS, DOMINIQUE MARIA.
Direct profiling of III/V semiconductor nanostructures at the atomic level by cross-sectional scanning tunneling microscopy.
1
Eindhoven:
Technische Universiteit Eindhoven,
2003.
TXB.
MLA Style
BRULS, DOMINIQUE MARIA.
Direct profiling of III/V semiconductor nanostructures at the atomic level by cross-sectional scanning tunneling microscopy.
1
Eindhoven:
Technische Universiteit Eindhoven,
2003.
TXB.
Turabian Style
BRULS, DOMINIQUE MARIA.
Direct profiling of III/V semiconductor nanostructures at the atomic level by cross-sectional scanning tunneling microscopy.
1
Eindhoven:
Technische Universiteit Eindhoven,
2003.
TXB.