APA Style
BOON, GERBEN. (2000).
Simultaneous determination of specimen composition and thickness using the transmission electron microscope (1).
Eindhoven:
Technische Universiteit Eindhoven.
Chicago Style
BOON, GERBEN.
Simultaneous determination of specimen composition and thickness using the transmission electron microscope.
1
Eindhoven:
Technische Universiteit Eindhoven,
2000.
TXB.
MLA Style
BOON, GERBEN.
Simultaneous determination of specimen composition and thickness using the transmission electron microscope.
1
Eindhoven:
Technische Universiteit Eindhoven,
2000.
TXB.
Turabian Style
BOON, GERBEN.
Simultaneous determination of specimen composition and thickness using the transmission electron microscope.
1
Eindhoven:
Technische Universiteit Eindhoven,
2000.
TXB.